dc.contributor.author | Travaly, Youssef | |
dc.contributor.author | Bamal, Mandeep | |
dc.contributor.author | Carbonell, Laure | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Van Olmen, Jan | |
dc.contributor.author | Iacopi, Francesca | |
dc.contributor.author | Van Hove, Marleen | |
dc.contributor.author | Stucchi, Michele | |
dc.contributor.author | Maex, Karen | |
dc.date.accessioned | 2021-10-16T20:15:18Z | |
dc.date.available | 2021-10-16T20:15:18Z | |
dc.date.issued | 2007-08 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12988 | |
dc.source | IIOimport | |
dc.title | On a more accurate assessment of scaled copper/low-k interconnects performance | |
dc.type | Journal article | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Van Olmen, Jan | |
dc.contributor.imecauthor | Stucchi, Michele | |
dc.contributor.imecauthor | Maex, Karen | |
dc.source.peerreview | no | |
dc.source.beginpage | 333 | |
dc.source.endpage | 340 | |
dc.source.journal | IEEE Trans. Semiconductor Manufacturing | |
dc.source.issue | 3 | |
dc.source.volume | 20 | |
imec.availability | Published - imec | |