Electrostatic force microscopy mapping of electrical conductivity of hydrogen-terminated diamond films
dc.contributor.author | Volodin, A. | |
dc.contributor.author | Toma, C. | |
dc.contributor.author | Bogdan, G. | |
dc.contributor.author | Deferme, W. | |
dc.contributor.author | Haenen, Ken | |
dc.contributor.author | Nesladek, Milos | |
dc.contributor.author | Van Haesendonck, Chris | |
dc.date.accessioned | 2021-10-16T21:33:03Z | |
dc.date.available | 2021-10-16T21:33:03Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13198 | |
dc.source | IIOimport | |
dc.title | Electrostatic force microscopy mapping of electrical conductivity of hydrogen-terminated diamond films | |
dc.type | Journal article | |
dc.contributor.imecauthor | Haenen, Ken | |
dc.contributor.imecauthor | Nesladek, Milos | |
dc.contributor.orcidimec | Haenen, Ken::0000-0001-6711-7367 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 142111 | |
dc.source.journal | Applied Physics Letters | |
dc.source.issue | 14 | |
dc.source.volume | 91 | |
imec.availability | Published - open access |