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dc.contributor.authorVolodin, A.
dc.contributor.authorToma, C.
dc.contributor.authorBogdan, G.
dc.contributor.authorDeferme, W.
dc.contributor.authorHaenen, Ken
dc.contributor.authorNesladek, Milos
dc.contributor.authorVan Haesendonck, Chris
dc.date.accessioned2021-10-16T21:33:03Z
dc.date.available2021-10-16T21:33:03Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13198
dc.sourceIIOimport
dc.titleElectrostatic force microscopy mapping of electrical conductivity of hydrogen-terminated diamond films
dc.typeJournal article
dc.contributor.imecauthorHaenen, Ken
dc.contributor.imecauthorNesladek, Milos
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage142111
dc.source.journalApplied Physics Letters
dc.source.issue14
dc.source.volume91
imec.availabilityPublished - open access


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