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Impact of random soft oxide breakdown on SRAM energy/delay drift

dc.contributor.authorWang, Hua
dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorCatthoor, Francky
dc.contributor.authorDehaene, Wim
dc.date.accessioned2021-10-16T21:37:11Z
dc.date.available2021-10-16T21:37:11Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13208
dc.sourceIIOimport
dc.titleImpact of random soft oxide breakdown on SRAM energy/delay drift
dc.typeJournal article
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage581
dc.source.endpage591
dc.source.journalIEEE Trans. Device and Materials Reliability
dc.source.issue4
dc.source.volume7
imec.availabilityPublished - open access


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