dc.contributor.author | Yu, HongYu | |
dc.contributor.author | Chang, Shou-Zen | |
dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Lauwers, Anne | |
dc.contributor.author | Adelmann, Christoph | |
dc.contributor.author | Onsia, Bart | |
dc.contributor.author | Lehnen, Peer | |
dc.contributor.author | Kauerauf, Thomas | |
dc.contributor.author | Brus, Stephan | |
dc.contributor.author | Absil, Philippe | |
dc.contributor.author | Biesemans, Serge | |
dc.date.accessioned | 2021-10-16T21:53:29Z | |
dc.date.available | 2021-10-16T21:53:29Z | |
dc.date.issued | 2007-11 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13249 | |
dc.source | IIOimport | |
dc.title | Demonstration of low Vt Ni-FUSI N-MOSFETs with SiON dielectrics by using a Dy2O3 cap layer | |
dc.type | Journal article | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.contributor.imecauthor | Lauwers, Anne | |
dc.contributor.imecauthor | Adelmann, Christoph | |
dc.contributor.imecauthor | Onsia, Bart | |
dc.contributor.imecauthor | Brus, Stephan | |
dc.contributor.imecauthor | Absil, Philippe | |
dc.contributor.imecauthor | Biesemans, Serge | |
dc.contributor.orcidimec | Adelmann, Christoph::0000-0002-4831-3159 | |
dc.source.peerreview | no | |
dc.source.beginpage | 957 | |
dc.source.endpage | 959 | |
dc.source.journal | IEEE Electron Device Letters | |
dc.source.issue | 11 | |
dc.source.volume | 28 | |
imec.availability | Published - imec | |