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Effects of measurement temperature on NBTI

dc.contributor.authorZhang, J.F.
dc.contributor.authorChang, M.H.
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T21:58:23Z
dc.date.available2021-10-16T21:58:23Z
dc.date.issued2007-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13260
dc.sourceIIOimport
dc.titleEffects of measurement temperature on NBTI
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage298
dc.source.endpage300
dc.source.journalIEEE Electron Device Letters
dc.source.issue4
dc.source.volume28
imec.availabilityPublished - open access


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