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RF and 1/F noise investigations on MESFETS and circuits transplanted by epitaxial lift off

dc.contributor.authorMorf, T.
dc.contributor.authorBrys, Catherine
dc.contributor.authorVan Daele, Peter
dc.contributor.authorDemeester, Piet
dc.contributor.authorBenedickter, H.
dc.contributor.authorBächtold, W.
dc.date.accessioned2021-09-29T15:13:44Z
dc.date.available2021-09-29T15:13:44Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1355
dc.sourceIIOimport
dc.titleRF and 1/F noise investigations on MESFETS and circuits transplanted by epitaxial lift off
dc.typeJournal article
dc.contributor.imecauthorVan Daele, Peter
dc.contributor.imecauthorDemeester, Piet
dc.contributor.orcidimecVan Daele, Peter::0000-0003-0557-7741
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1489
dc.source.endpage1494
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue9
dc.source.volume43
imec.availabilityPublished - open access


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