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dc.contributor.authorCrupi, Giovanni
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorAngelov, Itoh
dc.contributor.authorCaddemi, Adelina
dc.contributor.authorParvais, Bertrand
dc.date.accessioned2021-10-17T06:40:22Z
dc.date.available2021-10-17T06:40:22Z
dc.date.issued2008
dc.identifier.issn1553-0396
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13577
dc.sourceIIOimport
dc.titleNon-linear FinFET modeling: Lookup table versus empirical approach
dc.typeJournal article
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.source.peerreviewyes
dc.source.beginpage157
dc.source.endpage164
dc.source.journalInternational Journal of Microwave and Optical Technology
dc.source.issue3
dc.source.volume3
imec.availabilityPublished - imec


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