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Characterization of molecular sieve coating using ellipsometric porosimetry

dc.contributor.authorEslava Fernandez, Salvador
dc.contributor.authorBaklanov, Mikhaïl
dc.contributor.authorKirschhock, Christine E. A.
dc.contributor.authorIacopi, Francesca
dc.contributor.authorAldea, Steliana
dc.contributor.authorMaex, Karen
dc.contributor.authorMartens, Johan A.
dc.date.accessioned2021-10-17T07:01:35Z
dc.date.available2021-10-17T07:01:35Z
dc.date.issued2008
dc.identifier.issn0743-7463
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13700
dc.sourceIIOimport
dc.titleCharacterization of molecular sieve coating using ellipsometric porosimetry
dc.typeJournal article
dc.contributor.imecauthorMaex, Karen
dc.source.peerreviewyes
dc.source.beginpage12811
dc.source.endpage12816
dc.source.journalLangmuir
dc.source.issue26
dc.source.volume23
imec.availabilityPublished - imec


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