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Methodology for flatband voltage measurement in fully depleted floating-body FinFETs

dc.contributor.authorFerain, Isabelle
dc.contributor.authorPantisano, Luigi
dc.contributor.authorO'Sullivan, Barry
dc.contributor.authorSinganamalla, Raghunath
dc.contributor.authorCollaert, Nadine
dc.contributor.authorJurczak, Gosia
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-17T07:05:44Z
dc.date.available2021-10-17T07:05:44Z
dc.date.issued2008
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13721
dc.sourceIIOimport
dc.titleMethodology for flatband voltage measurement in fully depleted floating-body FinFETs
dc.typeJournal article
dc.contributor.imecauthorO'Sullivan, Barry
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.orcidimecO'Sullivan, Barry::0000-0002-9036-8241
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1657
dc.source.endpage1663
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue7
dc.source.volume55
imec.availabilityPublished - open access


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