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Physical understanding and modeling of SANOS retention in programmed state

dc.contributor.authorFurnemont, Arnaud
dc.contributor.authorCacciato, Antonio
dc.contributor.authorBreuil, Laurent
dc.contributor.authorRosmeulen, Maarten
dc.contributor.authorMaes, Herman
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorVan Houdt, Jan
dc.date.accessioned2021-10-17T07:10:03Z
dc.date.available2021-10-17T07:10:03Z
dc.date.issued2008-04
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13742
dc.sourceIIOimport
dc.titlePhysical understanding and modeling of SANOS retention in programmed state
dc.typeJournal article
dc.contributor.imecauthorFurnemont, Arnaud
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorVan Houdt, Jan
dc.contributor.orcidimecFurnemont, Arnaud::0000-0002-6378-1030
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimecVan Houdt, Jan::0000-0003-1381-6925
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage577
dc.source.endpage583
dc.source.journalSolid-State Electronics
dc.source.issue4
dc.source.volume52
imec.availabilityPublished - open access


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