On the roll-off the activation energy plot in high-temperature flas memory retention tests and its impacts on the reliability assessment

dc.contributor.author	Govoreanu, Bogdan
dc.contributor.author	Van Houdt, Jan
dc.date.accessioned	2021-10-17T07:23:14Z
dc.date.available	2021-10-17T07:23:14Z
dc.date.issued	2008-02
dc.identifier.issn	0741-3106
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/13802
dc.source	IIOimport
dc.title	On the roll-off the activation energy plot in high-temperature flas memory retention tests and its impacts on the reliability assessment
dc.type	Journal article
dc.contributor.imecauthor	Govoreanu, Bogdan
dc.contributor.imecauthor	Van Houdt, Jan
dc.contributor.orcidimec	Van Houdt, Jan::0000-0003-1381-6925
dc.date.embargo	9999-12-31
dc.source.peerreview	yes
dc.source.beginpage	177
dc.source.endpage	179
dc.source.journal	IEEE Electron Device Letters
dc.source.issue	2
dc.source.volume	29
imec.availability	Published - open access