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A rigorous study of measurement techniques for negative bias temperature instability

dc.contributor.authorGrasser, T.
dc.contributor.authorWagner, P. J.
dc.contributor.authorHehenberger, P.
dc.contributor.authorGoes, W.
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-17T07:23:55Z
dc.date.available2021-10-17T07:23:55Z
dc.date.issued2008-09
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13805
dc.sourceIIOimport
dc.titleA rigorous study of measurement techniques for negative bias temperature instability
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage526
dc.source.endpage536
dc.source.journalIEEE Transactions on Device and Materials Reliability
dc.source.issue3
dc.source.volume8
dc.identifier.urlhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=4655591&isnumber=4655569
imec.availabilityPublished - open access


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