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Ex situ variable angle spectroscopic ellipsometry studies on chemical vapor deposited boron-doped diamond films: layered structure and modeling aspects

dc.contributor.authorGupta, S.
dc.contributor.authorDudipala, A.
dc.contributor.authorWilliams, Oliver
dc.contributor.authorHaenen, Ken
dc.contributor.authorBohannan, E.
dc.date.accessioned2021-10-17T07:29:09Z
dc.date.available2021-10-17T07:29:09Z
dc.date.issued2008
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13828
dc.sourceIIOimport
dc.titleEx situ variable angle spectroscopic ellipsometry studies on chemical vapor deposited boron-doped diamond films: layered structure and modeling aspects
dc.typeJournal article
dc.contributor.imecauthorHaenen, Ken
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage73514
dc.source.journalJournal of Applied Physics
dc.source.issue7
dc.source.volume104
imec.availabilityPublished - open access


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