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dc.contributor.authorDhaene, T.
dc.contributor.authorMartens, Luc
dc.contributor.authorDe Zutter, Daniel
dc.date.accessioned2021-09-29T12:40:58Z
dc.date.available2021-09-29T12:40:58Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/138
dc.sourceIIOimport
dc.titleExtended Bennia-Riad criterion for iterative frequency-domain deconvolution
dc.typeJournal article
dc.contributor.imecauthorMartens, Luc
dc.contributor.imecauthorDe Zutter, Daniel
dc.contributor.orcidimecMartens, Luc::0000-0001-9948-9157
dc.source.peerreviewno
dc.source.beginpage176
dc.source.endpage180
dc.source.journalIEEE Trans. Instrumentation and Measurement
dc.source.issue2
dc.source.volume43
imec.availabilityPublished - imec
imec.internalnotes10th Annual IEEE Instrumentation and Measurement Technology Conference - IMTC '93. 18-20 May 1993; irvine, CA, USA


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