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Proton irradiation effects on the performance of Si1-xGex devices

dc.contributor.authorOhyama, Hidenori
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorTakami, Y.
dc.contributor.authorHayama, Kiyoteru
dc.contributor.authorTokyama, J.
dc.contributor.authorHakata, T.
dc.contributor.authorKudou, T.
dc.contributor.authorSunaga, H.
dc.contributor.authorNashiyama, I.
dc.contributor.authorUwatoko, Y.
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.date.accessioned2021-09-29T15:15:28Z
dc.date.available2021-09-29T15:15:28Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1390
dc.sourceIIOimport
dc.titleProton irradiation effects on the performance of Si1-xGex devices
dc.typeJournal article
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.beginpage325
dc.source.endpage32
dc.source.journalPhysica Status Solidi A
dc.source.issue1
dc.source.volume158
imec.availabilityPublished - imec


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