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Low-frequency noise in nFinFETs of different dimensions processed in strained and non-strained SOI wafers

dc.contributor.authorLukyanchikova, N.
dc.contributor.authorGarbar, N.
dc.contributor.authorKudina, V.
dc.contributor.authorSmolanka, A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-17T08:36:41Z
dc.date.available2021-10-17T08:36:41Z
dc.date.issued2008
dc.identifier.issn1560-8034
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14081
dc.sourceIIOimport
dc.titleLow-frequency noise in nFinFETs of different dimensions processed in strained and non-strained SOI wafers
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage203
dc.source.endpage208
dc.source.journalSemiconductor Physics, Quantum Electronics and Optoelectronics
dc.source.issue3
dc.source.volume11
imec.availabilityPublished - open access


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