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Analog performance of standard and strained triple-gate nFINFETS

dc.contributor.authorPavanello, M.A.
dc.contributor.authorMartino, J.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorRooyackers, Rita
dc.contributor.authorCollaert, Nadine
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-10-17T09:42:10Z
dc.date.available2021-10-17T09:42:10Z
dc.date.issued2008
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14289
dc.sourceIIOimport
dc.titleAnalog performance of standard and strained triple-gate nFINFETS
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage1904
dc.source.endpage1909
dc.source.journalSolid-State Electronics
dc.source.issue12
dc.source.volume52
imec.availabilityPublished - imec


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