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A fast procedure to accurately determine leaky modes in multilayered planar dielectric substrates

dc.contributor.authorRogier, Hendrik
dc.contributor.authorVande Ginste, Dries
dc.date.accessioned2021-10-17T10:14:20Z
dc.date.available2021-10-17T10:14:20Z
dc.date.issued2008
dc.identifier.issn0018-9480
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14384
dc.sourceIIOimport
dc.titleA fast procedure to accurately determine leaky modes in multilayered planar dielectric substrates
dc.typeJournal article
dc.contributor.imecauthorRogier, Hendrik
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.orcidimecRogier, Hendrik::0000-0001-8139-2736
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1413
dc.source.endpage1422
dc.source.journalIEEE Transactions on Microwave Theory and Techniques
dc.source.issue6
dc.source.volume56
imec.availabilityPublished - open access


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