Hydrogen diffusion in silicon from plasma-enhanced chemical vapor deposited silicon nitride film at high temperature
dc.contributor.author | Sheoran, M. | |
dc.contributor.author | Kim, D.S. | |
dc.contributor.author | Rohatgi, A. | |
dc.contributor.author | Dekkers, Harold | |
dc.contributor.author | Beaucarne, Guy | |
dc.contributor.author | Young, M. | |
dc.contributor.author | Asher, S. | |
dc.date.accessioned | 2021-10-17T10:42:16Z | |
dc.date.available | 2021-10-17T10:42:16Z | |
dc.date.issued | 2008 | |
dc.identifier.issn | 0003-6951 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/14463 | |
dc.source | IIOimport | |
dc.title | Hydrogen diffusion in silicon from plasma-enhanced chemical vapor deposited silicon nitride film at high temperature | |
dc.type | Journal article | |
dc.contributor.imecauthor | Dekkers, Harold | |
dc.contributor.orcidimec | Dekkers, Harold::0000-0003-4778-5709 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 172107 | |
dc.source.journal | Applied Physics Letters | |
dc.source.issue | 17 | |
dc.source.volume | 92 | |
imec.availability | Published - open access |