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Characterization of individual interface traps with charge pumping

dc.contributor.authorSaks, N.S.
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDe Wolf, Ingrid
dc.date.accessioned2021-09-29T15:21:15Z
dc.date.available2021-09-29T15:21:15Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1451
dc.sourceIIOimport
dc.titleCharacterization of individual interface traps with charge pumping
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDe Wolf, Ingrid
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1383
dc.source.endpage1385
dc.source.journalApplied Physics Letters
dc.source.issue10
dc.source.volume68
imec.availabilityPublished - open access


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