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Demonstration of defect modes in coupled microresonator arrays fabricated in silicon-on-insulator technology

dc.contributor.authorTobing, L.Y.M.
dc.contributor.authorDumon, Pieter
dc.contributor.authorBaets, Roel
dc.contributor.authorChin, M.-K.
dc.date.accessioned2021-10-17T11:19:15Z
dc.date.available2021-10-17T11:19:15Z
dc.date.issued2008-09
dc.identifier.issn0146-9592
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14564
dc.sourceIIOimport
dc.titleDemonstration of defect modes in coupled microresonator arrays fabricated in silicon-on-insulator technology
dc.typeJournal article
dc.contributor.imecauthorBaets, Roel
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1939
dc.source.endpage1941
dc.source.journalOptics Letters
dc.source.issue17
dc.source.volume33
imec.availabilityPublished - open access


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