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New developments in charge pumping measurements on thin stacked dielectrics

dc.contributor.authorToledano-Luque, Maria
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorZahid, Mohammed
dc.contributor.authorPantisano, Luigi
dc.contributor.authorDegraeve, Robin
dc.contributor.authorSan Andres, Enrique
dc.date.accessioned2021-10-17T11:20:21Z
dc.date.available2021-10-17T11:20:21Z
dc.date.issued2008
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14567
dc.sourceIIOimport
dc.titleNew developments in charge pumping measurements on thin stacked dielectrics
dc.typeJournal article
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3184
dc.source.endpage3191
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue11
dc.source.volume55
imec.availabilityPublished - open access


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