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Systems-in-foil - Devices, fabrication processes and reliability issues

dc.contributor.authorvan den Brand, J.
dc.contributor.authorDe Baets, Johan
dc.contributor.authorvan Mol, T.
dc.contributor.authorDietzel, A.
dc.date.accessioned2021-10-17T11:42:22Z
dc.date.available2021-10-17T11:42:22Z
dc.date.issued2008
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14626
dc.sourceIIOimport
dc.titleSystems-in-foil - Devices, fabrication processes and reliability issues
dc.typeJournal article
dc.contributor.imecauthorDe Baets, Johan
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1123
dc.source.endpage1128
dc.source.journalMicroelectronics Reliability
dc.source.issue8_9
dc.source.volume48
imec.availabilityPublished - open access


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