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Pulsed stress reliability investigations of Schottky diodes and HBTs

dc.contributor.authorSchuessler, M.
dc.contributor.authorKrozer, V.
dc.contributor.authorBock, Karlheinz
dc.contributor.authorHartnagel, H. L.
dc.date.accessioned2021-09-29T15:23:35Z
dc.date.available2021-09-29T15:23:35Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1469
dc.sourceIIOimport
dc.titlePulsed stress reliability investigations of Schottky diodes and HBTs
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage1907
dc.source.endpage1910
dc.source.journalMicroelectronics and Reliability
dc.source.volume36
imec.availabilityPublished - imec
imec.internalnotesPaper from ESREF '96 - 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. October 8-11, 1996. Enschede, The Netherlands.


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