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Cryogenic readout electronics & technology for FIRST's stressed array

dc.contributor.authorSeijnaeve, Joost
dc.contributor.authorDierickx, Bart
dc.contributor.authorScheffer, Danny
dc.contributor.authorHermans, Lou
dc.contributor.authorHaspeslagh, Luc
dc.date.accessioned2021-09-29T15:23:57Z
dc.date.available2021-09-29T15:23:57Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1472
dc.sourceIIOimport
dc.titleCryogenic readout electronics & technology for FIRST's stressed array
dc.typeJournal article
dc.contributor.imecauthorHaspeslagh, Luc
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpageC3-187
dc.source.endpageC3-191
dc.source.journalJournal de Physique IV. Colloque 3
dc.source.volume6
imec.availabilityPublished - open access
imec.internalnotesProceedings 2nd European Workshop on Low Temperature Electronics (WOLTE-2). June 26-28, 1996. Leuven, Belgium.


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