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Te-induced modulation of the Mo/HfO2 interface effective work function

dc.contributor.authorXiong, Ka
dc.contributor.authorDelugas, Pietro
dc.contributor.authorHooker, Jacob
dc.contributor.authorFiorentini, Vincenzo
dc.contributor.authorRoberston, John
dc.contributor.authorLiu, Dameng
dc.contributor.authorPourtois, Geoffrey
dc.date.accessioned2021-10-17T12:55:21Z
dc.date.available2021-10-17T12:55:21Z
dc.date.issued2008
dc.identifier.issn0003-6951
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14806
dc.sourceIIOimport
dc.titleTe-induced modulation of the Mo/HfO2 interface effective work function
dc.typeJournal article
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.source.peerreviewyes
dc.source.beginpage113504
dc.source.journalApplied Physics Letters
dc.source.issue11
dc.source.volume92
imec.availabilityPublished - imec


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