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The low-frequency noise behaviour of silicon-on-insulator technologies

dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T15:25:24Z
dc.date.available2021-09-29T15:25:24Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1484
dc.sourceIIOimport
dc.titleThe low-frequency noise behaviour of silicon-on-insulator technologies
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage949
dc.source.endpage960
dc.source.journalSolid-State Electronics
dc.source.issue7
dc.source.volume39
imec.availabilityPublished - open access


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