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On the relationship between the bulk recombination lifetime and the excess 1/f noise in silicon p-n junction diodes

dc.contributor.authorSimoen, Eddy
dc.contributor.authorVanhellemont, Jan
dc.contributor.authorClaeys, Cor
dc.date.accessioned2021-09-29T15:26:58Z
dc.date.available2021-09-29T15:26:58Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1496
dc.sourceIIOimport
dc.titleOn the relationship between the bulk recombination lifetime and the excess 1/f noise in silicon p-n junction diodes
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage961
dc.source.endpage963
dc.source.journalSolid State Communications
dc.source.volume98
imec.availabilityPublished - open access


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