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DC and low frequency noise characterization of FINFET devices

dc.contributor.authorBennamane, K.
dc.contributor.authorBoutchacha, T.
dc.contributor.authorGhibaudo, G.
dc.contributor.authorMouis, M.
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2021-10-17T21:22:09Z
dc.date.available2021-10-17T21:22:09Z
dc.date.issued2009
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/14976
dc.sourceIIOimport
dc.titleDC and low frequency noise characterization of FINFET devices
dc.typeJournal article
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.identifier.doi10.1016/j.sse.2009.09.032
dc.source.peerreviewyes
dc.source.beginpage1263
dc.source.endpage1267
dc.source.journalSolid-State Electronics
dc.source.issue12
dc.source.volume53
imec.availabilityPublished - imec


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