dc.contributor.author | Cornagliotti, Emanuele | |
dc.contributor.author | Kang, Xuanwu | |
dc.contributor.author | Beaucarne, Guy | |
dc.contributor.author | John, Joachim | |
dc.contributor.author | Poortmans, Jef | |
dc.contributor.author | Mertens, Robert | |
dc.date.accessioned | 2021-10-17T21:39:50Z | |
dc.date.available | 2021-10-17T21:39:50Z | |
dc.date.issued | 2009 | |
dc.identifier.issn | 0034-6748 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15127 | |
dc.source | IIOimport | |
dc.title | High sensitivity photoconductivity based measurement setup for the determination of effective recombination lifetime in silicon wafers | |
dc.type | Journal article | |
dc.contributor.imecauthor | Cornagliotti, Emanuele | |
dc.contributor.imecauthor | John, Joachim | |
dc.contributor.imecauthor | Poortmans, Jef | |
dc.contributor.imecauthor | Mertens, Robert | |
dc.contributor.orcidimec | Poortmans, Jef::0000-0003-2077-2545 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 53906 | |
dc.source.journal | Review of Scientific Instruments | |
dc.source.issue | 5 | |
dc.source.volume | 80 | |
dc.identifier.url | www.scitation.com | |
imec.availability | Published - open access | |