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Purely analytical extraction of an improved nonlinear FinFET model including non-quasi-static effects

dc.contributor.authorCrupi, Giovanni
dc.contributor.authorSchreurs, Dominique
dc.contributor.authorCaddemia, Adelina
dc.contributor.authorAngelov, Itoh
dc.contributor.authorHomayouni, Majid
dc.contributor.authorRaffo, Antonio
dc.contributor.authorVannini, Giorgio
dc.contributor.authorParvais, Bertrand
dc.date.accessioned2021-10-17T21:43:01Z
dc.date.available2021-10-17T21:43:01Z
dc.date.issued2009
dc.identifier.issn0167-9317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15148
dc.sourceIIOimport
dc.titlePurely analytical extraction of an improved nonlinear FinFET model including non-quasi-static effects
dc.typeJournal article
dc.contributor.imecauthorSchreurs, Dominique
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.source.peerreviewyes
dc.source.beginpage2283
dc.source.endpage2289
dc.source.journalMicroelectronic Engineering
dc.source.issue11
dc.source.volume86
imec.availabilityPublished - imec


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