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Charge trapping in organic transistor memories: on the role of electrons and holes

dc.contributor.authorDebucquoy, Maarten
dc.contributor.authorRockele, Maarten
dc.contributor.authorGenoe, Jan
dc.contributor.authorGelinck, Gerwin
dc.contributor.authorHeremans, Paul
dc.date.accessioned2021-10-17T21:51:55Z
dc.date.available2021-10-17T21:51:55Z
dc.date.issued2009
dc.identifier.issn1566-1199
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15201
dc.sourceIIOimport
dc.titleCharge trapping in organic transistor memories: on the role of electrons and holes
dc.typeJournal article
dc.contributor.imecauthorDebucquoy, Maarten
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecDebucquoy, Maarten::0000-0001-5980-188X
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.source.peerreviewyes
dc.source.beginpage1252
dc.source.endpage1258
dc.source.journalOrganic Electronics
dc.source.issue7
dc.source.volume10
imec.availabilityPublished - imec


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