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Transmission electron microscopy characterization of ion beam synthesized FeSi2 layers

dc.contributor.authorTavares, J.
dc.contributor.authorBender, Hugo
dc.contributor.authorMaex, Karen
dc.date.accessioned2021-09-29T15:30:48Z
dc.date.available2021-09-29T15:30:48Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1523
dc.sourceIIOimport
dc.titleTransmission electron microscopy characterization of ion beam synthesized FeSi2 layers
dc.typeJournal article
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorMaex, Karen
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage90
dc.source.endpage97
dc.source.journalThin Solid Films
dc.source.volume277
imec.availabilityPublished - open access


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