Show simple item record

Single-electron capacitance spectroscopy of individual dopants in silicon

dc.contributor.authorGasseler, M
dc.contributor.authorLoo, Roger
dc.contributor.authorHarrison, J.F
dc.contributor.authorCaymax, Matty
dc.contributor.authorRogge, Sven
dc.contributor.authorTessmer, S.H.
dc.date.accessioned2021-10-17T22:18:15Z
dc.date.available2021-10-17T22:18:15Z
dc.date.issued2009-12
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15329
dc.sourceIIOimport
dc.titleSingle-electron capacitance spectroscopy of individual dopants in silicon
dc.typeJournal article
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.source.peerreviewno
dc.source.beginpage0904.2617v2
dc.source.journalarXiv,org: Condensed Matter: Mesoscale and Nanoscale Physics
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record