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Testing of SOCs with hierarchical cores: common fallacies, test-access optimization, and test scheduling

dc.contributor.authorGoel, Sandeep K.
dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorSehgal, Anuja
dc.contributor.authorChakrabarty, Krishnendu
dc.date.accessioned2021-10-17T22:24:45Z
dc.date.available2021-10-17T22:24:45Z
dc.date.issued2009
dc.identifier.issn0018-9340
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15358
dc.sourceIIOimport
dc.titleTesting of SOCs with hierarchical cores: common fallacies, test-access optimization, and test scheduling
dc.typeJournal article
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.beginpage409
dc.source.endpage423
dc.source.journalIEEE Transactions on Computers
dc.source.issue3
dc.source.volume58
imec.availabilityPublished - imec


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