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Degradation of the reset switching during endurance testing of a phase-change line cell

dc.contributor.authorGoux, Ludovic
dc.contributor.authorTio Castro, David
dc.contributor.authorHurkx, Fred
dc.contributor.authorLisoni, Judit
dc.contributor.authorDelhougne, Romain
dc.contributor.authorGravesteijn, Dirk
dc.contributor.authorAttenborough, Karen
dc.contributor.authorWouters, Dirk
dc.date.accessioned2021-10-17T22:29:51Z
dc.date.available2021-10-17T22:29:51Z
dc.date.issued2009
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15380
dc.sourceIIOimport
dc.titleDegradation of the reset switching during endurance testing of a phase-change line cell
dc.typeJournal article
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.source.peerreviewyes
dc.source.beginpage354
dc.source.endpage358
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue2
dc.source.volume56
imec.availabilityPublished - imec


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