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Toward engineering modeling of negative bias temperature instability

dc.contributor.authorGrasser, Tibor
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-17T22:32:38Z
dc.date.available2021-10-17T22:32:38Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15392
dc.sourceIIOimport
dc.titleToward engineering modeling of negative bias temperature instability
dc.typeBook chapter
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage399
dc.source.bookDefects in Microelectronic Materials and Devices
dc.source.endpage436
imec.availabilityPublished - open access
imec.internalnotesChapter 14


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