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A new method for obtaining the shape sensitivities of planar microstrip structures by a full-wave analysis

dc.contributor.authorUreel, Jan
dc.contributor.authorDe Zutter, Daniel
dc.date.accessioned2021-09-29T15:34:10Z
dc.date.available2021-09-29T15:34:10Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1545
dc.sourceIIOimport
dc.titleA new method for obtaining the shape sensitivities of planar microstrip structures by a full-wave analysis
dc.typeJournal article
dc.contributor.imecauthorDe Zutter, Daniel
dc.source.peerreviewno
dc.source.beginpage249
dc.source.endpage260
dc.source.journalIEEE Trans. Microwave Theory and Techniques
dc.source.volume44
imec.availabilityPublished - imec


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