Size-dependent resistivity in nanoscale interconnects
dc.contributor.author | Jossell, Daniel | |
dc.contributor.author | Brongersma, Sywert | |
dc.contributor.author | Tokei, Zsolt | |
dc.date.accessioned | 2021-10-17T23:14:06Z | |
dc.date.available | 2021-10-17T23:14:06Z | |
dc.date.issued | 2009 | |
dc.identifier.issn | 1531-7331 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15550 | |
dc.source | IIOimport | |
dc.title | Size-dependent resistivity in nanoscale interconnects | |
dc.type | Journal article | |
dc.contributor.imecauthor | Brongersma, Sywert | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.orcidimec | Brongersma, Sywert::0000-0002-1755-3897 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 231 | |
dc.source.endpage | 254 | |
dc.source.journal | Annual Review of Materials Research | |
dc.source.volume | 39 | |
imec.availability | Published - open access |