Deep defects in GaN/AlGaN/SiC heterostructures
dc.contributor.author | Kindl, D. | |
dc.contributor.author | Hubik, P. | |
dc.contributor.author | Kristofik, J. | |
dc.contributor.author | Mares, J.J. | |
dc.contributor.author | Vyborny, Z. | |
dc.contributor.author | Leys, Maarten | |
dc.contributor.author | Boeykens, Steven | |
dc.date.accessioned | 2021-10-17T23:28:19Z | |
dc.date.available | 2021-10-17T23:28:19Z | |
dc.date.issued | 2009 | |
dc.identifier.issn | 0021-8979 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15601 | |
dc.source | IIOimport | |
dc.title | Deep defects in GaN/AlGaN/SiC heterostructures | |
dc.type | Journal article | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 93706 | |
dc.source.journal | Journal of Applied Physics | |
dc.source.issue | 9 | |
dc.source.volume | 105 | |
imec.availability | Published - open access |