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dc.contributor.authorKindl, D.
dc.contributor.authorHubik, P.
dc.contributor.authorKristofik, J.
dc.contributor.authorMares, J.J.
dc.contributor.authorVyborny, Z.
dc.contributor.authorLeys, Maarten
dc.contributor.authorBoeykens, Steven
dc.date.accessioned2021-10-17T23:28:19Z
dc.date.available2021-10-17T23:28:19Z
dc.date.issued2009
dc.identifier.issn0021-8979
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15601
dc.sourceIIOimport
dc.titleDeep defects in GaN/AlGaN/SiC heterostructures
dc.typeJournal article
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage93706
dc.source.journalJournal of Applied Physics
dc.source.issue9
dc.source.volume105
imec.availabilityPublished - open access


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