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Comprehensive investigation of trap-assisted conduction in ultra-thin SrTiO3 layers

dc.contributor.authorManger, Dirk
dc.contributor.authorKaczer, Ben
dc.contributor.authorMenou, Nicolas
dc.contributor.authorClima, Sergiu
dc.contributor.authorWouters, Dirk
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorKittl, Jorge
dc.date.accessioned2021-10-18T00:32:50Z
dc.date.available2021-10-18T00:32:50Z
dc.date.issued2009
dc.identifier.issn0167-9317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15814
dc.sourceIIOimport
dc.titleComprehensive investigation of trap-assisted conduction in ultra-thin SrTiO3 layers
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1815
dc.source.endpage1817
dc.source.journalMicroelectronic Engineering
dc.source.issue7_9
dc.source.volume86
imec.availabilityPublished - open access
imec.internalnotesINFOS 2009


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