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Diagnostics of the quality of MOSFETs

dc.contributor.authorVandamme, Ewout
dc.contributor.authorVandamme, Lorenz
dc.date.accessioned2021-09-29T15:42:43Z
dc.date.available2021-09-29T15:42:43Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1599
dc.sourceIIOimport
dc.titleDiagnostics of the quality of MOSFETs
dc.typeJournal article
dc.source.peerreviewno
dc.source.beginpage1107
dc.source.endpage1112
dc.source.journalMicroelectronics and Reliability
dc.source.volume36
imec.availabilityPublished - imec


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