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Justifications for reducing HBM and MM ESD qualification test time

dc.contributor.authorVerhaege, Koen
dc.contributor.authorRobinson-Hahn, D.
dc.contributor.authorRuss, Christian
dc.contributor.authorFarris, M.
dc.contributor.authorScanlon, J.
dc.contributor.authorLin, D.
dc.contributor.authorVeltri, J.
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-09-29T15:48:16Z
dc.date.available2021-09-29T15:48:16Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1630
dc.sourceIIOimport
dc.titleJustifications for reducing HBM and MM ESD qualification test time
dc.typeJournal article
dc.contributor.imecauthorGroeseneken, Guido
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1715
dc.source.endpage1718
dc.source.journalMicroelectronics and Reliability
dc.source.volume36
imec.availabilityPublished - open access
imec.internalnotesPaper from ESREF '96 - 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. October 8-11, 1996. Enschede, The Netherlands.


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