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Accurate on-wafer measurement of the large-signal behavior of a nonlinear microwave device

dc.contributor.authorVerspecht, J.
dc.contributor.authorDebie, Peter
dc.contributor.authorMartens, Luc
dc.contributor.authorBarel, A.
dc.date.accessioned2021-09-29T15:49:42Z
dc.date.available2021-09-29T15:49:42Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1638
dc.sourceIIOimport
dc.titleAccurate on-wafer measurement of the large-signal behavior of a nonlinear microwave device
dc.typeJournal article
dc.contributor.imecauthorMartens, Luc
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage35
dc.source.endpage45
dc.source.journalHF Revue - HF Tijdschrift
dc.source.issue2
imec.availabilityPublished - open access


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