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Intrinsic granularity in nanocrystalline boron-doped diamond films measured by scanning tunneling microscopy

dc.contributor.authorWillems, B.L.
dc.contributor.authorDao, V.H.
dc.contributor.authorVanacken, J.
dc.contributor.authorChibotaru, L.F.
dc.contributor.authorMoshchalkov, V.V.
dc.contributor.authorGuillamon, I.
dc.contributor.authorSuderow, H.
dc.contributor.authorVieira, S.
dc.contributor.authorJanssens, S.D.
dc.contributor.authorWilliams, Oliver
dc.contributor.authorHaenen, Ken
dc.contributor.authorWagner, Patrick
dc.date.accessioned2021-10-18T05:15:48Z
dc.date.available2021-10-18T05:15:48Z
dc.date.issued2009
dc.identifier.issn1098-0121
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16539
dc.sourceIIOimport
dc.titleIntrinsic granularity in nanocrystalline boron-doped diamond films measured by scanning tunneling microscopy
dc.typeJournal article
dc.contributor.imecauthorHaenen, Ken
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.source.peerreviewyes
dc.source.beginpage224518
dc.source.journalPhysical Review B
dc.source.issue22
dc.source.volume80
imec.availabilityPublished - imec


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