The isocurrent test: a promising tool for wafer-level evaluation of the interconnect reliability

dc.contributor.author	Witvrouw, Ann
dc.contributor.author	Van Dooren, Sofie
dc.contributor.author	Wouters, Dirk
dc.contributor.author	Van Dievel, Marc
dc.contributor.author	Maex, Karen
dc.date.accessioned	2021-09-29T15:53:55Z
dc.date.available	2021-09-29T15:53:55Z
dc.date.issued	1996
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1661
dc.source	IIOimport
dc.title	The isocurrent test: a promising tool for wafer-level evaluation of the interconnect reliability
dc.type	Journal article
dc.contributor.imecauthor	Van Dievel, Marc
dc.contributor.imecauthor	Maex, Karen
dc.date.embargo	9999-12-31
dc.source.peerreview	no
dc.source.beginpage	1847
dc.source.endpage	1850
dc.source.journal	Microelectronics and Reliability
dc.source.volume	36
imec.availability	Published - open access
imec.internalnotes	Paper from ESREF '96 - 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. October 8-11, 1996. Enschede, The Netherlands.