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Influence of the ferroelectric domain structure and switching properties on the endurance of PZT ferroelectric capacitors

dc.contributor.authorWouters, Dirk
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-09-29T15:54:29Z
dc.date.available2021-09-29T15:54:29Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1664
dc.sourceIIOimport
dc.titleInfluence of the ferroelectric domain structure and switching properties on the endurance of PZT ferroelectric capacitors
dc.typeJournal article
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage1763
dc.source.endpage1766
dc.source.journalMicroelectronics and Reliability
dc.source.volume36
imec.availabilityPublished - open access
imec.internalnotesPaper from ESREF '96 - 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis. October 8-11, 1996. Enschede, The Netherlands.


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