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Bias Temperature Instabilities in MOSFETs with High-k Dielectrics

dc.contributor.authorAoulaiche, Marc
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-18T15:15:50Z
dc.date.available2021-10-18T15:15:50Z
dc.date.issued2010
dc.identifier.isbn978-3-8383-6404-
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/16658
dc.sourceIIOimport
dc.titleBias Temperature Instabilities in MOSFETs with High-k Dielectrics
dc.typeBook
dc.contributor.imecauthorGroeseneken, Guido
dc.source.numberofpages224
dc.source.peerreviewno
dc.identifier.urlhttp://www.amazon.co.uk/Bias-Temperature-Instabilities-MOSFETs-high-k-dielectrics-Temperature/dp/383836404X
imec.availabilityPublished - imec


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