dc.contributor.author | Bellenger, Florence | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Nyns, Laura | |
dc.contributor.author | Zahid, Mohammed | |
dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Vrancken, Evi | |
dc.contributor.author | Tseng, Joshua | |
dc.contributor.author | Caymax, Matty | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | De Meyer, Kristin | |
dc.contributor.author | Heyns, Marc | |
dc.contributor.author | Hoffmann, Thomas Y. | |
dc.date.accessioned | 2021-10-18T15:19:41Z | |
dc.date.available | 2021-10-18T15:19:41Z | |
dc.date.issued | 2010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/16728 | |
dc.source | IIOimport | |
dc.title | Ge FETs gate stack passivation options and their scalability to low EOT | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Nyns, Laura | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | Vrancken, Evi | |
dc.contributor.imecauthor | Caymax, Matty | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | De Meyer, Kristin | |
dc.contributor.imecauthor | Heyns, Marc | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Nyns, Laura::0000-0001-8220-870X | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.source.peerreview | no | |
dc.source.beginpage | 1040 | |
dc.source.endpage | 1041 | |
dc.source.conference | International Conference on Solid State Devices and Materials - SSDM | |
dc.source.conferencedate | 22/09/2010 | |
dc.source.conferencelocation | Tokyo Japan | |
imec.availability | Published - imec | |