Electro-optical characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures
dc.contributor.author | Zeng, A. | |
dc.contributor.author | Jackson, M. K. | |
dc.contributor.author | Van Hove, Marleen | |
dc.contributor.author | De Raedt, Walter | |
dc.date.accessioned | 2021-09-29T15:57:52Z | |
dc.date.available | 2021-09-29T15:57:52Z | |
dc.date.issued | 1996 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/1682 | |
dc.source | IIOimport | |
dc.title | Electro-optical characterization of modulation-doped field-effect transistors with monolithically-integrated test fixtures | |
dc.type | Journal article | |
dc.contributor.imecauthor | De Raedt, Walter | |
dc.source.peerreview | no | |
dc.source.beginpage | 867 | |
dc.source.endpage | 874 | |
dc.source.journal | Optical and Quantum Electronics | |
dc.source.volume | 28 | |
imec.availability | Published - imec |
Files in this item
Files | Size | Format | View |
---|---|---|---|
There are no files associated with this item. |